A. Merassi: search on Z-Library

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1

A new on-chip test structure for real time fatigue analysis in polysilicon MEMS

G. Langfelder, A. Longoni, F. Zaraga, A. Corigliano, A. Ghisi, A. Merassi

Journal:

Microelectronics Reliability

Year:

2009

Language:

english

File:

PDF, 1.50 MB

english, 2009

2

[IEEE 2009 IEEE Sensors - Christchurch, New Zealand (2009.10.25-2009.10.28)] 2009 IEEE Sensors - Real-time monitoring of the fatigue damage accumulation in polysilicon microstructures at different applied stresses

Langfelder, Giacomo, Longoni, Antonio, Zaraga, Federico, Corigliano, Alberto, Ghisi, Aldo, Merassi, Angelo

Year:

2009

Language:

english

File:

PDF, 2.16 MB

english, 2009

3

LVI-based failure analysis after PRBS defect activation: Two cases study

Marcello, G., Merassi, A., Medda, M.

Journal:

Microelectronics Reliability

Year:

2019

Language:

english

File:

PDF, 4.52 MB

english, 2019

4

A microsystem for the fracture characterization of polysilicon at the micro-scale

A. Corigliano, A. Ghisi, G. Langfelder, A. Longoni, F. Zaraga, A. Merassi

Journal:

European Journal of Mechanics - A/Solids

Year:

2011

Language:

english

File:

PDF, 1.58 MB

english, 2011

5

[IEEE 2008 IEEE Sensors - Lecce, Italy (2008.10.26-2008.10.29)] 2008 IEEE Sensors - A polysilicon test structure for fatigue and fracture testing in micro electro mechanical devices

Langfelder, G., Longoni, A., Zaraga, F., Corigliano, A., Ghisi, A., Merassi, A.

Year:

2008

Language:

english

File:

PDF, 724 KB

english, 2008